Z-contrast imaging investigation of stacking faults in Cr_2Ta Laves phase;
Cr_2Ta中层错的Z衬度像研究
Progress of transmission electron microscopy Ⅱ Z-contrast imaging,Sub-angstrom transmission electron microscopy,Aberration-corrected transmission electron microscopy;
透射电子显微学的新进展Ⅱ Z衬度像、亚埃透射电子显微学、像差校正透射电子显微学
Theoretical analysis of the contrast of image under water;
水下影像衬度的理论分析
Failure point was localized by using liquid crystals and voltage contrast image technology,combining with the circuit analysis and the layout of the chip,the relationship between failure mode and failing behavior was discussed,and the cause of the failure was verified by experiments.
利用液晶热点定位和电压衬度像等技术手段,准确定位了一时序逻辑电路的失效部位,结合电路原理分析以及芯片版图,详细解释了器件失效模式与失效现象的关系,并对其失效原因进行了实验验证。