Method of measuring roundness error based on equal thickness interference;
基于等厚干涉原理的圆度误差测量方法
Research of a video camera type experiment instrument for equal thickness interference;
摄像型等厚干涉实验仪器的研究
Algorithm for zone parameter calculation in annular subapertures stitching based on equal thickness interference;
基于等厚干涉的环形子孔径检测中环带参数的计算方法
Using a computer to detect and procese the experimental data of interference of equal thickness;
等厚干涉实验数据的计算机检测与处理
this paper describes the localization of interference of equal thickness,and according to the condition of the spatial coherence,gives the concrete expression of the center of localization and depth of localization in the rectangular coordinates.
讨论了等厚干涉中的定域问题,并由空间相干性的观点给出了定域中心和定域深度在直角坐标系中的具体表达式。
In studying the interference of equal thickness in wedge films, the formula of difference of optical path is strictly deduced, and the tenable conditions of the optical path difference equation in traditional textbook is clarified.
研究了劈尖等厚干涉问题,对其光程差公式进行了严格推导,阐明了传统教材光程差公式成立的条件。
Comparison of Newton rings and equal inclination interference;
牛顿环与等倾干涉条纹比较
Computer simulates and analyzes the temporal coherence of light of equal inclination interference;
用计算机模拟分析等倾干涉的时间相干性
Experiment of multiple beam equal inclination interference fringes;
多光束等倾干涉圆环的实验研究
Analysis of Uncertainty of Non-Weighted Measurement In Uniform Thickness Interference
等厚干涉中非等精度测量的不确定度分析
Studies of Auto Measuring System of Curvature Radius of Optical Sphere on White Light s Equal Thickness Interference Principle;
基于白光等厚干涉原理的光学球面曲率半径自动测量系统研究
Thermal Refractive Index Coefficients of Colorless Optical Glass and Equal Thickness Interference Fringe of Optical Flat
无色光学玻璃折射率温度系数与平晶等厚干涉条纹
Impact of glass thickness of the Michelson interferometer on the interference fringe
玻片厚度对迈克耳孙干涉仪干涉条纹的影响
Measuring thickness of epitaxial layers of gallium arsenide by infrared interference
GB/T8758-1988砷化镓外延层厚度红外干涉测量方法
Study on the Thickness and Characteristics of Oil-film on Watersurface Based on White-light Interferometer;
水面油膜厚度及油品特性的白光干涉测量研究
Refractive Index and Thickness of Michelson Interferometer Measure Film;
迈克尔逊干涉仪测量薄膜的折射率与厚度
A Study on Acoustic Impedance Matching Criteria for Coating Thickness Measurement by Ultrasonic Interferometry
超声干涉法涂层厚度测量声阻抗匹配判据研究
Thickness Measurement of Thin Film Based on White-Light Spectral Interferometry
基于白光干涉的光学薄膜物理厚度测量方法
Measuring thin-film thickness with phase-shift interferometry
基于相位偏移干涉术的薄膜厚度测量方法
Contoured Correlation Interferometry for Electronic Speckle Pattern Interferometry and Synthetic Aperture Radar Interferometry;
电子散斑与合成孔径雷达干涉测量中的等值线相关干涉法
THE THICKNESS AND REFACTURE INDEX OF SINGLELAYER FILM MEASURED BY MICHELSON INTERFEROMETER
用迈克尔逊干涉仪测量单层薄膜的厚度和折射率
Theory and System Research for Ultra-Thin Metallic Foil Thickness Measurement Based on White Light Interference;
基于白光干涉的金属极薄带测厚理论与系统研究
Acoustic Impedance Matching Criteria and Their Applications for Layer Thickness Measurement by Ultrasonic Interferometry
超声干涉法薄层厚度测量声阻抗匹配判据及其应用
Diagnostics of the Electric Arc Plasma by Mono-wavelength Laser Interferometry with Optical Flat
电弧等离子体的单波长激光平晶干涉诊断
Diagnosing Microwave Plasma Thruster s Plume by Holographic Interferometry;
等离子体羽流场的光学全息干涉度量技术研究
Differential Laser Interferometry for Dense Plasma Density Measurement;
激光差分干涉测量稠密等离子体密度技术研究
A Multi-frame Mach-Zehnder Interferometer for Measuring the Plasma of Z-Pinch;
用于Z箍缩等离子体诊断的多幅M-Z干涉仪