The crystal polytypes and luminescent properties of the film were characterized by reflection high energy electron diffraction (RHEED) and photoluminescence (PL), respectively.
利用固源分子束外延(SSMBE)生长技术,在1350K的衬底温度下,通过改变Si束流强度,在6H-SiC(0001)面上外延生长6H-SiC/3C-SiC/6H-SiC量子阱结构薄膜,并用反射高能电子衍射(RHEED)与光致发光(PL)谱对生长的薄膜的晶型和发光特性进行表征。
The growth process of the films was in situ monitored by reflective high energy electron diffraction(RHEED).
通过反射高能电子衍射 (RHEED)仪原位实时监测薄膜生长 ,研究薄膜的生长过程。
In this paper, the principle of reflection high energy electron diffraction (RHEED) is introduced.
本文介绍了反射高能电子衍射的工作原理，并将其与低能电子衍射进行了比较，表明ＲＨＥＥＤ具有很多优越性。
The lattice strain in as-prepared BaTiO_3/SrTiO_3 superlattice was analyzed with reflective high energy electronic diffraction(RHEED),X-ray diffraction(XRD) and selective area electron diffraction(SAED).
综合利用反射式高能电子衍射系统(RHEED)、高分辨率X射线衍射(HRXRD)以及高分辨率透射电镜选区电子衍射(SAED)技术,研究超晶格薄膜的晶格应变现象和规律。
The growth process was in situ monitored with reflective high energy electron diffraction(RHEED).
通过反射式高能电子衍射 (RHEED)对生长过程进行原位监测 ,发现对基片的预热处理明显有利于改善其晶面结构 ,当在其上同质外延Sr TiO3 薄膜时 ,容易实现单晶层状生长模式 ,并得到原子级平整度的铁电薄膜。
SrTiO3/BaTiO3 multilayer films were grown on SrTiO3 (001) substrates by laser molecular beam epitaxy(L-MBE), the smooth of films surface was studied by the reflection high-energy electron diffraction (RHEED) and atomic force microscopy (AFM).
用激光分子束外延技术在SrTiO3(001)村底上外延生长SrTiO3/BaTiO3多层膜,通过反射式高能电子衍射(RHEED)原住实时监测并结合原子力显微镜(AFM),研究了不同基片温度下所生长薄膜的表面平整度,利用X射线衍射(XRD)对外延薄膜进行了结构分析,结果表明薄膜具有二维生长模式,在基片温度为380-470℃之间生长的薄膜具有原子级光滑,并且具有完全C轴取向。
reflection high energy electron diffraction spectroscopy
反射高能电子衍射能谱
reflected high energy electron diffractio
反射式高能电子衍射
Design of virtual reflection high energy electron diffraction experimental system
虚拟反射式高能电子衍射实验系统的设计
Combined Analysis of Urinary Stones by X-ray Photoelectron Spectroscopy and X-ray Powder Diffraction
泌尿系结石的X射线光电子能谱和X射线衍射联合分析
THE APPLICATION OF KIKUCHI MAPS IN THE HEED EXPERIMENT
菊池图在高能电子衍射实验中的应用
medium energy electron scattering spectroscopy
中能电子散射能谱学
X-ray photo-electron spectrometer (XPS)
X射线光电子能谱仪
X-ray photo electron spectroscopy (XPS)
X射线光电子能谱法
The Charge Compensation in Analysis of CeO_2 in X-ray Photoelectron Spectroscopy
CeO_2 X射线光电子能谱的电荷补偿分析
ANALYSIS OF ECE SPECTRA OF ENERGETIC ELECTRONS IN LHCD
低混杂电流驱动实验中高能电子的回旋辐射谱分析
energy dispersive X-ray diffractometer
能量扩散X射线衍射仪
External Total Reflection Angle X-ray Microanalysis of Thin Film;
薄膜外全反射角X射线能谱分析研究
inelastic neutron scattering spectroscopy
中子非弹性散射能谱学
cosmic-ray muon spectrometer
宇宙射线μ介子能谱仪
high resolution gamma ray spectrometry
高分辨 射线能谱测定法
The ability of the ionosphere to reflect these waves is dependent upon normal variations in the electron density at different levels.
电离层反射电波的能力取决于不同高度上电子密度的正常差别。
Cosmic rays and X-rays produce energetic electrons by ionization.
宇宙射线和X射线因其电离作用产生高能电子。
Only with very high-flux reactors is it usually possible to employ diffractometers of high angular resolution.
只有对非常高通量的反应堆，才可能应用高角分辨率的衍射计。