Measurements using X-ray double crystal diffraction(XDCD) were carried out to investigate the tilted angels of ZnTe and CdTe epilayers grown on 76mm Si(211) and GaAs(211)B substrates by molecular-beam epitaxy.
本文采用X射线双晶衍射二次测量法对76mmSi(211)和GaAs(211)B衬底上生长的ZnTe和CdTe外延层的晶向倾角进行了测量,发现对于Si和GaAs衬底,外延层的[211]均绕外延层与衬底的[0-11]复合轴朝[111]倾斜,其晶向倾角与晶格失配呈线性关系;通过实际测量验证了在外延层探测到的[133]峰代表[211]关于[111]旋转180°的[255]孪晶向。
In order to study the change of the transverse pitch and longitudinal pitch of ship hull during the process of ship launching by gasbag,a pitch measure system is applied which consists of pitch sensor,RS-232 serial bus and IPC.
为研究船舶气囊下水过程船体横向和纵向倾角的变化过程,采用基于工控机的倾角测试系统。