A Measurement of Aluminium (Al) lonization Cross Section On K-shell;
铝—K壳层电离截面的测量
Damaging enhancement on Inp[l00] surface induced by K-shell photoionization absorption of phosphorus or indium;
P和In原子K壳层X光吸收对InP单晶表面的损伤增强作用
In this paper, we give a description of recent progress on the measurements of electron-impact K-shell ionization cross-sections of atoms in the keV energy range.
首先评述了近年来该领域的一些研究进展,并通过测量Cr元素在小于26keV能量范围K壳层电离截面的例子介绍了研究组的实验方法。