In Situ monitoring of Epitaxy Growth by Differential RHEED under High Pressure;
高压强下外延生长的差分RHEED原位监测
New Progress in wafer epitaxy technologies for high-brightness white LEDs;
高亮度白光LED用外延片的新进展
Growth and characterization of GaN by lateral epitaxy overgrowth (LEO);
GaN材料的横向外延过生长(LEO)及其特性研究